Title :
Field emission for resonance sensing in MEMS/NEMS
Author :
Yang, C.K. ; Le Fèbre, A.J. ; Pandraud, G. ; van der Drift, E. ; French, P.J.
Author_Institution :
TU Delft, Delft
Abstract :
In the past decades, there is a considerable interest in the sensor community to move from micron to nano-devices, typically scaling of resonators such as cantilever beams. The scaled beams give advantages in faster response and higher sensitivity; however the detection of their resonance becomes challenging as dimensions scale down. In our work, we demonstrate the use of field emission characteristics as a detection method for scaled resonators. The advantages of using field emission are several: it is geometrically scalable without loss of signal, it has a high bandwidth and it can be integrated using standard fabrication processes.
Keywords :
field emission; microsensors; nanotechnology; MEMS; NEMS; cantilever beams; field emission; resonance sensing; scaled resonators; Current measurement; Data mining; Micromechanical devices; Nanoelectromechanical systems; Probes; Resonance; Resonant frequency; Sensor phenomena and characterization; Silicon; Voltage;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1133-7
Electronic_ISBN :
978-1-4244-1134-4
DOI :
10.1109/IVNC.2007.4480937