• DocumentCode
    3209986
  • Title

    Reliability testing of power units

  • Author

    Kunzinger, Frederick F.

  • Author_Institution
    AT&T Bell Labs., Parsippany, NJ, USA
  • fYear
    1988
  • fDate
    30 Oct-2 Nov 1988
  • Firstpage
    557
  • Lastpage
    565
  • Abstract
    The author discusses the trade-offs in formulating a plan for reliability testing of power products to gain more accurate knowledge of their mean time between failures (MTBF). Ways to estimate the sample size, test duration, and cost of such a program are presented in graphical form. The results are based on the constant-failure rate model. Results are presented in terms of an experimental plant to show that the MTBF of a power unit exceeds a certain lower bound with a 65% confidence level. Correction factors to adjust sample size to account for different confidence levels and ranges are shown. A factor to account for testing to show that an MTBF is bounded both above and below is also identified
  • Keywords
    failure analysis; power supplies to apparatus; reliability; confidence levels; constant-failure rate model; mean time between failures; power units; reliability testing; Costs; Manufacturing processes; Mathematics; Multichip modules; Power engineering and energy; Power system reliability; Reliability engineering; Semiconductor device reliability; Semiconductor device testing; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications Energy Conference, 1988. INTELEC '88., 10th International
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/INTLEC.1988.22408
  • Filename
    22408