• DocumentCode
    3209989
  • Title

    An automatic electroencephalography blinking artefact detection and removal method based on template matching and ensemble empirical mode decomposition

  • Author

    Bizopoulos, Paschalis A. ; Al-Ani, Tarik ; Tsalikakis, Dimitrios G. ; Tzallas, A.T. ; Koutsouris, Dimitrios D. ; Fotiadis, Dimitrios I.

  • Author_Institution
    Dept. Inf. et Telecommun., ESIEE-Paris, Noisy-Le-Grand, France
  • fYear
    2013
  • fDate
    3-7 July 2013
  • Firstpage
    5853
  • Lastpage
    5856
  • Abstract
    Electrooculographic (EOG) artefacts are one of the most common causes of Electroencephalogram (EEG) distortion. In this paper, we propose a method for EOG Blinking Artefacts (BAs) detection and removal from EEG. Normalized Correlation Coefficient (NCC), based on a predetermined BA template library was used for detecting the BA. Ensemble Empirical Mode Decomposition (EEMD) was applied to the contaminated region and a statistical algorithm determined which Intrinsic Mode Functions (IMFs) correspond to the BA. The proposed method was applied in simulated EEG signals, which were contaminated with artificially created EOG BAs, increasing the Signal-to-Error Ratio (SER) of the EEG Contaminated Region (CR) by 35dB on average.
  • Keywords
    electroencephalography; medical signal detection; medical signal processing; EEG contaminated region; EEMD; EOG; IMF; NCC; automatic electroencephalography blinking artefact detection; electroencephalogram distortion; electrooculographic artefacts; ensemble empirical mode decomposition; intrinsic mode functions; normalized correlation coefficient; predetermined BA template library; removal method; signal-to-error ratio; simulated EEG signals; statistical algorithm; template matching; Barium; Correlation coefficient; Data analysis; Electroencephalography; Electrooculography; Empirical mode decomposition; Pollution measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
  • Conference_Location
    Osaka
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2013.6610883
  • Filename
    6610883