Title :
New Results With Silicon Drift Detectors For X-ray Spectroscopy
Author :
Jalas, P. ; Niemeld, A. ; Chen, W. ; Rehak, P. ; Castoldi, A. ; Longoni, A.
Author_Institution :
Outokumpu Instruments
fDate :
31 Oct-6 Nov 1993
Keywords :
Capacitance; Energy resolution; FETs; Leak detection; Leakage current; Silicon; Spectroscopy; Temperature; X-ray detection; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
Print_ISBN :
0-7803-1487-5
DOI :
10.1109/NSSMIC.1993.701672
