DocumentCode

3209993

Title

New Results With Silicon Drift Detectors For X-ray Spectroscopy

Author

Jalas, P. ; Niemeld, A. ; Chen, W. ; Rehak, P. ; Castoldi, A. ; Longoni, A.

Author_Institution

Outokumpu Instruments

fYear

1993

fDate

31 Oct-6 Nov 1993

Firstpage

191

Lastpage

195

Keywords

Capacitance; Energy resolution; FETs; Leak detection; Leakage current; Silicon; Spectroscopy; Temperature; X-ray detection; X-ray detectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.

Print_ISBN

0-7803-1487-5

Type

conf

DOI

10.1109/NSSMIC.1993.701672

Filename

701672