• DocumentCode
    3210213
  • Title

    A multi-level DRAM with fast read and low power consumption

  • Author

    Liu, Bo ; Frenzel, James F. ; Wells, Richard B.

  • Author_Institution
    MRC Inst., Idaho Univ., Moscow, ID
  • fYear
    2005
  • fDate
    15-15 April 2005
  • Firstpage
    59
  • Lastpage
    62
  • Abstract
    In this paper, we present a new, multi-level DRAM design, which can store 3 voltage levels (0, Vcc, and Vcc/2) in a single memory cell. This multi-level DRAM requires no special reference voltage and simplifies design of the peripheral circuits. Coding algorithms may be used to provide binary data immediately after first read, with the second read operation providing a second data word from the same cell; thus, binary data from two logical addresses can be obtained from one physical location. One of the coding algorithms uses an additional coding memory cell for every two data memory cells to provide 4-bits of binary data. A second algorithm uses 3 additional coding cells for every 8 data cells to provide 8-bit binary data for each access; thus every 11 memory cells can provide 16 bits of binary data. Furthermore, the read speed is faster than a conventional DRAM because the first access can complete before the word line reaches Vccp, and because a SRAM differential sense amplifier is used. Finally, storing 3 voltage levels in a single memory cell also reduces average power consumption, since the Vcc/2 voltage level requires less write back current than 0 or Vcc voltage level
  • Keywords
    DRAM chips; binary codes; differential amplifiers; low-power electronics; SRAM; binary data; coding algorithms; coding memory cell; differential sense amplifier; logical addresses; low power consumption; multilevel DRAM; peripheral circuits; Circuit noise; Costs; Differential amplifiers; Energy consumption; Flash memory; Manufacturing industries; Noise level; Production; Random access memory; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Electron Devices, 2005. WMED '05. 2005 IEEE Workshop on
  • Conference_Location
    Boise, ID
  • Print_ISBN
    0-7803-9072-5
  • Type

    conf

  • DOI
    10.1109/WMED.2005.1431619
  • Filename
    1431619