DocumentCode :
3210395
Title :
Investigation on nanosecond-pulse breakdown
Author :
Yan, P. ; Wang, J. ; Shao, T.
Author_Institution :
Inst. of Electr. Eng., Chinese Acad. of Sci., Beijing, China
fYear :
2009
fDate :
1-5 June 2009
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given: There are many interesting phenomena in nanosecond-pulse breakdown process, especially in the repetition pulse. Data on electrical insulation and dielectric breakdown are a critical factor to mechanism analysis. In view of the requirement of data acquisition and safe operation in an experimental investigation of repetitive nanosecond-pulse breakdown in solid dielectric samples, a convenient and real-time method is presented to control the power generator and obtain some breakdown parameters. With a designed digital pulse transform circuit and two oscilloscopes, the measurement- acquisition and control system not only record applied voltage, breakdown current, and time-to-breakdown duration, but also shut off the power generator automatically when repetitive nanosecond pulses are applied and breakdown occurs. Furthermore, the number of applied pulses can be calculated by the product of the time duration and repetition rate. In order to avoiding unwanted over-current damage to the power generator, the maximum synchronously controllable repetition rate with the system should be 40 kHz when the measured time-to-breakdown duration error is taken into account. In addition, unconventional breakdown phenomenon in nanosecond-pulse is reported and explained.
Keywords :
electric breakdown; electric generators; insulation; oscilloscopes; breakdown current; data acquisition; dielectric breakdown; digital pulse transform circuit; electrical insulation; nanosecond-pulse breakdown; oscilloscopes; power generator; solid dielectric samples; time-to-breakdown duration error; Automatic generation control; Breakdown voltage; Control systems; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Power generation; Power measurement; Pulse circuits; Pulse measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science - Abstracts, 2009. ICOPS 2009. IEEE International Conference on
Conference_Location :
San Diego, CA
ISSN :
0730-9244
Print_ISBN :
978-1-4244-2617-1
Type :
conf
DOI :
10.1109/PLASMA.2009.5227262
Filename :
5227262
Link To Document :
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