Title :
The detailed analysis of field emission under stabilized operation using field effect transistor
Author :
Neo, Yoichiro ; Matsumoto, Takahiro ; Shimawaki, Hidetaka ; Mimura, Hidenori ; Yokoo, Kuniyoshi
Author_Institution :
Shizuoka Univ., Hamamatsu
Abstract :
In this report, the effect of field enhancement factor modulation and tip potential controlled by FET were described. The field enhancement factor: beta is easily controlled by potential distribution and the decrease of beta has the effect on reduction of drain voltage and makes the TFT area small. The new concept of stabilization and structure was demonstrated and suggested.
Keywords :
field effect transistors; field emission; thin film transistors; FET; field effect transistor; field emission; field enhancement factor modulation; 1f noise; Anodes; Cathodes; FETs; Fluctuations; Information analysis; Phosphors; Research and development; Thin film transistors; Voltage control;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1133-7
Electronic_ISBN :
978-1-4244-1134-4
DOI :
10.1109/IVNC.2007.4480961
