DocumentCode
3210870
Title
Effective current enhancement vs. aspect ratio for rectangular ridge cathodes
Author
Miller, R. ; Lau, Y.Y. ; Booske, J.
Author_Institution
Univ. of Wisconsin, Madison
fYear
2007
fDate
8-12 July 2007
Firstpage
169
Lastpage
170
Abstract
It is well known that electric fields necessary to produce appreciable electron current via field emission are on the order of Gv/m. An applied electric field is greatly enhanced in the neighborhood of sharp corners, edges, and tips, thus enabling field emission. In this work we used an analytical approach to calculate the surface field enhancement and the field emission current obtained from the "knife-edge" cathodes.
Keywords
cathodes; electron field emission; analytical approach; aspect ratio; effective current enhancement; electron current; field emission current; knife-edge cathodes; rectangular ridge cathodes; surface field enhancement; Cathodes; Conformal mapping; Copper; Electron emission; Laboratories; Lithography; Nuclear and plasma sciences; Power engineering and energy; Robustness; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location
Chicago, IL
Print_ISBN
978-1-4244-1133-7
Electronic_ISBN
978-1-4244-1134-4
Type
conf
DOI
10.1109/IVNC.2007.4480982
Filename
4480982
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