DocumentCode :
321091
Title :
Neuron-silicon junction: electrical recordings from neural cells cultured on modified microelectronic device surfaces
Author :
Offenhausser, Andreas ; Matsuzawa, Mieko ; Sprossler, C. ; Knoll, Wolfgang
Author_Institution :
Max-Planck-Inst. for Polymer Res., Mainz, Germany
Volume :
1
fYear :
1996
fDate :
31 Oct-3 Nov 1996
Firstpage :
307
Abstract :
A field-effect transistor (FET) array has been fabricated and used for recording of electrical signals from neural cells. The array consists of p-channel FETs with non-metallized gates. The size of the gates of the 16 FETs are from 28×12 μm2 down to 10×4 μm2 and are arranged in a 4×4 matrix on 200 μm centers. Electrical signals of neural cells can be recorded by direct coupling with the FET. In order to control the neuronal survival and growth, the microelectronic device surface is modified with a synthetic peptide linked to the surface via self-assembly techniques. It can be shown that the composition of the surface can be tuned in such a way that hippocampal neurons show good adhesion and growth for days. More importantly, these cells develop typical electrical characteristics when cultured on this artificial surface. Using this approach passive neuron FET couplings were recorded
Keywords :
bioelectric phenomena; biosensors; cellular biophysics; field effect transistors; monolayers; neural nets; neurophysiology; silicon; 10 micron; 12 micron; 200 micron; 28 micron; 4 micron; FET array; Si; adhesion; artificial surface; cultured neural cells; direct coupling; electrical recordings; hippocampal neurons; modified microelectronic device surfaces; neuron-silicon junction; neuronal survival; nonmetallized gates; p-channel FET; self-assembly techniques; synthetic peptide; Cells (biology); Electrodes; Etching; FETs; Glass; Microelectronics; Neurons; Peptides; Polymers; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
Type :
conf
DOI :
10.1109/IEMBS.1996.656966
Filename :
656966
Link To Document :
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