DocumentCode
3210921
Title
On the design and optimization of a switched-capacitor interface circuit for MEMS capacitive sensors
Author
Seraji, Najme Ebrahimi ; Yavari, Mohammad
Author_Institution
Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
fYear
2012
fDate
15-17 May 2012
Firstpage
286
Lastpage
290
Abstract
In this paper a switched-capacitor (SC) interface circuit that is intended for MEMS capacitive sensors is proposed and designed. In the proposed architecture, both correlated double sampling (CDS) and chopper stabilization (CHS) noise reduction techniques are applied to the interface circuit to reduce the amplifier offset and low frequency noise. The effects of parasitic capacitances between the sensor and its interface circuit which are usually larger than the sense capacitances are carefully analyzed and used to optimize the readout performance. In other words, by analyzing the circuit offset and noise performance in presence of these parasitic capacitances, the suitable values of the circuit parameters such as sampling frequency, chopping frequency, and amplifier unity gain bandwidth are calculated. In comparison to the circuit using only CDS or CHS technique, the resolution variation of the proposed readout circuit is less than 1aF in presence of parasitic capacitances varying up to 20 pF.
Keywords
amplifiers; capacitive sensors; choppers (circuits); circuit stability; integrated circuit design; integrated circuit noise; microsensors; optimisation; readout electronics; switched capacitor networks; CBS noise reduction technique; CDS technique; MEMS capacitive sensor; SC interface circuit; amplifier offset reduction; amplifier unity gain bandwidth; chopper stabilization noise reduction technique; chopping frequency; correlated double sampling technique; low frequency noise; optimization; parasitic capacitance effect; readout IIC performance; sampling frequency; switched-capacitor interface circuit; Integrated circuits; Noise; Capacitive interface circuit; MEMS capacitive sensors; noise reduction techniques; residual offset analysis; resolution variation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Engineering (ICEE), 2012 20th Iranian Conference on
Conference_Location
Tehran
Print_ISBN
978-1-4673-1149-6
Type
conf
DOI
10.1109/IranianCEE.2012.6292370
Filename
6292370
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