DocumentCode :
3210957
Title :
Direct growth of carbon nanotubes on a conical tip as a micro-focused x-ray generation source: Effects of various composition ratios of co-sputtered Ni and Co catalysts
Author :
Kim, Jong-Pil ; Park, Chang-Kyun ; Yun, Sung-Jun ; Kim, Won ; Kim, Young-Kwang ; Park, Jin-Seok
Author_Institution :
Hanyang Univ., Hanyang
fYear :
2007
fDate :
8-12 July 2007
Firstpage :
185
Lastpage :
186
Abstract :
In this study, we first present the experimental results that regard the direct growth of CNTs on a conical-type tungsten (W) tip and their electron emission properties, in terms of the catalyst materials such as a nickel (Ni) and a cobalt (Co) as well as their composition ratios. Sharpening of W-tips was done by electrochemical etch and their diameters were controlled to range from 5 mum down to sub-mum. The co-sputtering method using Ni and Co targets was used to deposit the catalyst layers with various composition ratios of Ni and Co metals. The composition ratio of the co-sputtered catalysts was evaluated by using an energy dispersive X-ray spectroscopy (EDS, Oxford). CNTs were grown by inductively coupled plasma-chemical vapor deposition (ICP-CVD).
Keywords :
X-ray chemical analysis; carbon nanotubes; catalysts; cobalt; electrochemistry; electron emission; etching; nickel; plasma CVD; sputtered coatings; tungsten; C; Co; Ni; W; carbon nanotubes growth; catalyst materials; co-sputtered cobalt catalysts; co-sputtered nickel catalysts; conical-type tungsten tip; electrochemical etching; electron emission properties; energy dispersive X-ray spectroscopy; inductively coupled plasma-chemical vapor deposition; microfocused X-ray generation source; Carbon nanotubes; Cobalt; Composite materials; Dispersion; Electron emission; Etching; Nickel; Plasma applications; Spectroscopy; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1133-7
Electronic_ISBN :
978-1-4244-1134-4
Type :
conf
DOI :
10.1109/IVNC.2007.4480987
Filename :
4480987
Link To Document :
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