Recognition of catastrophic faults

Author

Nayak, Amiya ; Pagli, Linda ; Santoro, Nicola

Author_Institution

Center for Parallel & Distributed Comput., Sch. of Comput. Sci., Carleton Univ., Ottawa, Ont., Canada

fYear

1992

fDate

4-6 Nov 1992

Firstpage

70

Lastpage

79

Abstract

For a given design, it is not difficult to identify a set of elements whose failure will have catastrophic consequence. There exist many patterns (random distribution) of faults, not in a block, which can be fatal for the system. Therefore, the characterization of such fault patterns is crucial for the identification, testing and detection of such catastrophic events. This paper, is concerned with the development of efficient recognition schemes; that is, efficient mechanisms which automatically determine whether or not an observed/detected pattern of faults will have catastrophic consequences. The problem of recognizing whether a fault pattern is catastrophic has been addressed

Keywords

fault tolerant computing; reconfigurable architectures; system recovery; catastrophic faults; fault patterns; fault-tolerant computing; observed/detected pattern; random distribution; reconfiguration; Computer science; Distributed computing; Event detection; Fault detection; Fault diagnosis; Fault tolerance; Pattern recognition; Redundancy; Sufficient conditions; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 1992. Proceedings., 1992 IEEE International Workshop on

Conference_Location

Dallas, TX

ISSN

1550-5774

Print_ISBN

0-8186-2837-5

Type

conf

DOI

10.1109/DFTVS.1992.224370

Filename

224370