Title :
A fuzzy multiple signature compaction scheme for BIST
Author :
Wu, Yuejian ; Ivanov, André
Author_Institution :
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
Abstract :
Compared to single signature analysis, checking multiple signatures yields smaller aliasing, easier fault coverage computation, shorter average test-time, and increased fault diagnosability. In conventional multiple signature (CMS) schemes, for a CUT to be declared good, at each check point, the signature obtained must match a specific reference. This strict one-to-one correspondence makes the CMS scheme complex to implement and expensive in terms of silicon area. The authors propose a fuzzy multiple signature compaction scheme in which the requirement for the one-to-one correspondence is removed. In the FMS scheme, for a CUT to be declared good, it suffices that the signature obtained at each check point correspond to any of a set of references
Keywords :
built-in self test; fault location; fuzzy logic; logic testing; signal processing; BIST; aliasing; fault diagnosability; fuzzy multiple signature compaction; logic testing; simulation; test-time; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Collision mitigation; Compaction; Computational modeling; Flexible manufacturing systems; Hardware; Silicon;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224400