• DocumentCode
    3211265
  • Title

    A fuzzy multiple signature compaction scheme for BIST

  • Author

    Wu, Yuejian ; Ivanov, André

  • Author_Institution
    Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
  • fYear
    1992
  • fDate
    26-27 Nov 1992
  • Firstpage
    247
  • Lastpage
    252
  • Abstract
    Compared to single signature analysis, checking multiple signatures yields smaller aliasing, easier fault coverage computation, shorter average test-time, and increased fault diagnosability. In conventional multiple signature (CMS) schemes, for a CUT to be declared good, at each check point, the signature obtained must match a specific reference. This strict one-to-one correspondence makes the CMS scheme complex to implement and expensive in terms of silicon area. The authors propose a fuzzy multiple signature compaction scheme in which the requirement for the one-to-one correspondence is removed. In the FMS scheme, for a CUT to be declared good, it suffices that the signature obtained at each check point correspond to any of a set of references
  • Keywords
    built-in self test; fault location; fuzzy logic; logic testing; signal processing; BIST; aliasing; fault diagnosability; fuzzy multiple signature compaction; logic testing; simulation; test-time; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Collision mitigation; Compaction; Computational modeling; Flexible manufacturing systems; Hardware; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
  • Conference_Location
    Hiroshima
  • Print_ISBN
    0-8186-2985-1
  • Type

    conf

  • DOI
    10.1109/ATS.1992.224400
  • Filename
    224400