Title :
Synthesis of autonomous TPG circuits oriented for two-pattern testing
Author :
FURUYA, KIYOSHI ; Seki, Seiji ; McCluskey, Edward J.
Author_Institution :
Dept. of Inf. & Syst. Eng., Chuo Univ., Tokyo, Japan
Abstract :
A method to design one-dimensional cellular arrays for use as TPG circuits is described. The interconnections between cells are not limited to adjacent ones but allowed to some neighbors. Completely regular structures that have full-transition coverages for every k -dimensional subspace of state variables are first shown. Then, almost regular arrays which can operate on maximal cycles are derived based on fast parallel implementations of LFSRs
Keywords :
built-in self test; cellular arrays; logic design; logic testing; sequential circuits; shift registers; autonomous TPG circuits; full-transition coverages; interconnections; k-dimensional subspace; linear feedback shift registers; one-dimensional cellular arrays; parallel implementations; pseudo-random pattern generation; regular structures; two-pattern testing; Boundary conditions; Built-in self-test; Circuit synthesis; Circuit testing; Content addressable storage; Design methodology; Integrated circuit interconnections; Logic testing; Polynomials; Test pattern generators;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224402
