Title :
Exhaustive two-pattern generation with cellular automata
Author :
Nandi, Sukumar ; Chaudhuri, P. Pal ; Roy, Samir ; Sharma, M.
Author_Institution :
Indian Inst. of Technol., Kharagpur, India
Abstract :
Two-patterns are required to test a transistor stuck-open fault or a delay fault within a combinational circuit. Cellular automata (CA) has been proposed as a two pattern generator. For a 2n-cell CA structure, the condition to generate all possible exhaustive two-pattern n-bits have been investigated. Criteria to select the most desirable CA structure have also been laid down
Keywords :
built-in self test; cellular automata; delays; design for testability; fault location; logic testing; VLSI; cellular automata; combinational circuit; delay fault; exhaustive two-pattern generation; stuck-open fault; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Design for testability; Electrical fault detection; Fault detection; Logic testing; Very large scale integration;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224403
