Title :
Correction to Thermal Impedance Measurements Made Under Non-Equilibrium Conditions
Author_Institution :
Polytech. Univ. of Catalunya, Barcelona
Abstract :
The measurement of semiconductor device thermal impedance is in general easier to perform experimentally if the heating and measuring phases are performed separately in order to avoid mutual interference. However, unless we are able to guarantee that the system is in equilibrium before performing the measurement, the result is not the real thermal impedance. This work presents a method to extend the validity of a measurement made under non-equilibrium conditions to fit the real value of thermal impedance.
Keywords :
semiconductor device measurement; thermal variables measurement; nonequilibrium conditions; semiconductor device thermal impedance; thermal impedance measurements; Heating; Impedance measurement; Performance evaluation; Phase measurement; Semiconductor device measurement; Semiconductor devices; Switches; Temperature measurement; Temperature sensors; Time measurement; Cool-down measurement; Heat-up measurement; Thermal equilibrium; Thermal impedance; Thermal time constants;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems, 2007. MIXDES '07. 14th International Conference on
Conference_Location :
Ciechocinek
Print_ISBN :
83-922632-9-4
Electronic_ISBN :
83-922632-9-4
DOI :
10.1109/MIXDES.2007.4286186
