• DocumentCode
    3211351
  • Title

    Syndrome testable design software package, instrument and Syndrome testing system for sequential circuits

  • Author

    Wang, Fanglei ; Wang, Jijie

  • Author_Institution
    Shanghai Univ. of Sci. & Technol., China
  • fYear
    1992
  • fDate
    26-27 Nov 1992
  • Firstpage
    218
  • Lastpage
    222
  • Abstract
    Syndrome testing and Syndrome design for testability are very difficult to put into practice. The authors propose some research results which can solve these difficulties. They include computer aid Syndrome testable design, Syndrome structured design for testability and multiple Syndrome testing instrument, etc. These techniques open the way for putting Syndrome testing and Syndrome design for testability into practice
  • Keywords
    automatic test equipment; automatic testing; design for testability; logic CAD; logic testing; sequential circuits; software packages; Syndrome design for testability; Syndrome structured design; Syndrome testing system; multiple Syndrome testing instrument; sequential circuits; software package; Circuit testing; Combinational circuits; Design for testability; Instruments; Sequential analysis; Sequential circuits; Software design; Software packages; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
  • Conference_Location
    Hiroshima
  • Print_ISBN
    0-8186-2985-1
  • Type

    conf

  • DOI
    10.1109/ATS.1992.224405
  • Filename
    224405