DocumentCode
3211351
Title
Syndrome testable design software package, instrument and Syndrome testing system for sequential circuits
Author
Wang, Fanglei ; Wang, Jijie
Author_Institution
Shanghai Univ. of Sci. & Technol., China
fYear
1992
fDate
26-27 Nov 1992
Firstpage
218
Lastpage
222
Abstract
Syndrome testing and Syndrome design for testability are very difficult to put into practice. The authors propose some research results which can solve these difficulties. They include computer aid Syndrome testable design, Syndrome structured design for testability and multiple Syndrome testing instrument, etc. These techniques open the way for putting Syndrome testing and Syndrome design for testability into practice
Keywords
automatic test equipment; automatic testing; design for testability; logic CAD; logic testing; sequential circuits; software packages; Syndrome design for testability; Syndrome structured design; Syndrome testing system; multiple Syndrome testing instrument; sequential circuits; software package; Circuit testing; Combinational circuits; Design for testability; Instruments; Sequential analysis; Sequential circuits; Software design; Software packages; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location
Hiroshima
Print_ISBN
0-8186-2985-1
Type
conf
DOI
10.1109/ATS.1992.224405
Filename
224405
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