Title :
Hearing aid electromagnetic interference from digital cellular telephones
Author_Institution :
Food & Drug Admin., Center for Devices & Radiological Health, Rockville, MA, USA
fDate :
31 Oct-3 Nov 1996
Abstract :
Several in-the-ear (ITE) and behind-the-ear (BTE) hearing aids were tested for audible interference at various distances from five types of digital cellular telephones. The interference, which takes the form of a buzzing and a static sound, was quantified using a calibrated system including a frequency analyzer and a pressure field microphone. The output of the each hearing aid was coupled to the microphone via Tygon tubing and a standard 2 cc coupler. The highest interference induced sound pressure level (SPL), 122.5 dB, was measured from a BTE hearing aid placed within 2 cm of a transmitting GSM phone. In this case, interference was detected up to a separation distance of almost 3 meters. While all phones tested produced a similar interference level within 2 cm of this hearing aid, interference SPL from the CDMA based system decreased more rapidly with distance than the TDMA based phones tested. Subjective testing was also conducted using a listening stethoscope in order to further characterize the interference
Keywords :
cellular radio; code division multiple access; electromagnetic interference; hearing aids; time division multiple access; 122.5 dB; 2 cm; 3 m; BTE hearing aid; CDMA based system; TDMA based phones; audible interference; behind-the-ear aids; buzzing; digital cellular telephones; electromagnetic interference; frequency analyzer; hearing aid; in-the-ear aids; interference induced sound pressure level; pressure field microphone; static sound; subjective testing; transmitting GSM phone; Auditory system; Electromagnetic interference; Frequency; GSM; Hearing aids; Microphones; Multiaccess communication; Pressure measurement; System testing; Telephony;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.657017