Title :
Parameters Identification of Embedded PTAT Temperature Sensors for CMOS Circuits
Author :
Golda, A. ; Kos, A.
Author_Institution :
AGH Univ. of Sci. & Technol., Krakow
Abstract :
In this paper, we describe the parameters identification results of PTAT (proportional to absolute temperature) temperature sensors that are implemented in the test chip and dedicated to CMOS integrated circuits. Theirs principles of operation are based on the vertical PNP structure. These sensing elements are uniformly distributed on the chip surface. The chip is dedicated to analyses and verifications of various electro-thermal phenomena in microelectronic VLSI circuits and is fabricated in CMOS 0.7 mum technology. The measurements were performed in a thermal chamber for the temperature range of 288-358 K. The achieved sensitivities of the temperature sensors are within following limits 3.44 to 4.82 mV/K.
Keywords :
CMOS integrated circuits; integrated circuit design; integrated circuit testing; intelligent sensors; parameter estimation; temperature sensors; CMOS integrated circuits; electro-thermal phenomena; embedded PTAT temperature sensors; microelectronic VLSI circuits; parameters identification; proportional-to-absolute temperature sensors; size 0.7 mum; temperature 288 K to 358 K; thermal chamber; vertical PNP structure; CMOS integrated circuits; CMOS technology; Circuit testing; Integrated circuit technology; Integrated circuit testing; Microelectronics; Parameter estimation; Semiconductor device measurement; Temperature sensors; Very large scale integration; CMOS circuits; Embedded temperature sensors; Measurements; PTAT;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems, 2007. MIXDES '07. 14th International Conference on
Conference_Location :
Ciechocinek
Print_ISBN :
83-922632-9-4
Electronic_ISBN :
83-922632-9-4
DOI :
10.1109/MIXDES.2007.4286190
