• DocumentCode
    3211436
  • Title

    Synthesis for testability of PLA based finite state machines

  • Author

    Avedillo, M.J. ; Quintana, J.M. ; Huertas, J.L.

  • Author_Institution
    Dept. de Diseno Analogico, CNM, Sevilla, Spain
  • fYear
    1992
  • fDate
    26-27 Nov 1992
  • Firstpage
    194
  • Lastpage
    199
  • Abstract
    A new procedure for the synthesis of easily testable PLA-based finite state machines is presented. All combinational irredundant crosspoint faults in the PLA implementing the combinational component of the machine are testable. The machines produced have short machine-independent justification sequences for each state. The maximum length of these sequences is nv. A unit length sequence verifies that the machine has been actually placed in the reset state after the application of the reset input. The authors have developed an algorithm which does not use fault simulation. Combinational fault simulation is introduced in order to reduce the number of test vectors needed. There is an area overhead associated to the increment in testability. These area penalties have been shown to be smaller for larger machines. The scheme reduces the area overhead of similar approaches previously reported
  • Keywords
    combinatorial circuits; design for testability; fault location; finite state machines; logic arrays; logic design; PLA; area overhead; area penalties; combinational irredundant crosspoint faults; finite state machines; logic design; logic synthesis; synthesis; testability; unit length sequence; Automata; Benchmark testing; Clocks; Fault detection; Fault diagnosis; Hardware; Logic testing; Programmable logic arrays; Sequential analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
  • Conference_Location
    Hiroshima
  • Print_ISBN
    0-8186-2985-1
  • Type

    conf

  • DOI
    10.1109/ATS.1992.224409
  • Filename
    224409