• DocumentCode
    3211472
  • Title

    Efficiency of surface conduction electron emission from ZnO nanostructure

  • Author

    Wei, Lei ; Zhang, Xiaobing ; Zhu, Zuoya ; Yang, Guodong ; Huang, Chengxian

  • Author_Institution
    Southeast Univ., Nanjing
  • fYear
    2007
  • fDate
    8-12 July 2007
  • Firstpage
    247
  • Lastpage
    248
  • Abstract
    In this paper, we study the influence of the ZnO nanostructures, gap between cathode and gate, resistance of ZnO layer, and the accelerate electric field on the ration of Ia/Ig. Fig.3 gives the variation of gate current and anode current with different cathode-gate distance. From these curves, the electron emission efficiency can be estimated.
  • Keywords
    II-VI semiconductors; electric fields; electron emission; wide band gap semiconductors; zinc compounds; ZnO; accelerate electric field; anode current; cathode-gate distance; electron emission; gate current; surface conduction; Acceleration; Anodes; Cathodes; Displays; Electric resistance; Electrodes; Electron emission; Research and development; Voltage; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-1133-7
  • Electronic_ISBN
    978-1-4244-1134-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2007.4481016
  • Filename
    4481016