DocumentCode
321151
Title
Analysis of FES-induced upper limb motion for machine learning control
Author
Fujita, K. ; Shiga, K. ; Takahashi, H.
Author_Institution
Dept. of Comput. & Inf. Sci., Iwate Univ., Morioka, Japan
Volume
1
fYear
1996
fDate
31 Oct-3 Nov 1996
Firstpage
445
Abstract
Automatic generation of stimulus parameters is an attractive alternative to manual configuration in upper extremity FES due to the large number of electrodes and stimulus parameters that need to be adjusted. The nonlinear relationship between stimulus and motion, and the biomechanical interaction among muscles were analyzed to determine the feasibility of using machine learning technique. A stepped stimulation paradigm was applied to one electrode while a continuous bias stimulation was applied to a second electrode in an incomplete hemiplegic subject. 43 Stimulus combinations were tested. The resulting limb motions (7 joint angles) were measured using a three-dimensional magnetic tracking system. The biomechanical interaction, e.g. the supinator depression by the wrist extensor was quantitatively described. It was shown that the quantification of the stimulus-motion relationship and the muscle interaction is possible by using the proposed method
Keywords
biocontrol; bioelectric phenomena; biomechanics; learning (artificial intelligence); muscle; orthotics; FES-induced upper limb motion analysis; biomechanical interaction; continuous bias stimulation; functional electric stimulation; incomplete hemiplegic subject; machine learning control; manual configuration; nonlinear relationship; stepped stimulation paradigm; stimulus combinations; stimulus parameters; stimulus-motion relationship; supinator depression; three-dimensional magnetic tracking system; wrist extensor; Automatic control; Elbow; Electrodes; Extremities; Machine learning; Motion analysis; Motion control; Muscles; Shoulder; Wrist;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location
Amsterdam
Print_ISBN
0-7803-3811-1
Type
conf
DOI
10.1109/IEMBS.1996.657035
Filename
657035
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