Title :
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) [Front Cover and Table of Contents]
Abstract :
Presents the table of contents/splash page of the proceedings record.
Keywords :
circuit CAD; circuit layout CAD; logic CAD; analogue modelling; block Krylov methods; built-in self-test; circuit simulation; circuit verification; clock design; code generation; covering problem; decision diagrams; electronic design automation; encoding; fault diagnosis; fault simulation; hardware/software codesign; high-level power prediction; high-level validation; high-performance digital circuits; integrated circuits; interconnects; logic synthesis; low power; microelectromechanical systems; networks; noise analysis; optimization; parasitics extraction; partitioning; placement; power bounds; power estimation; power reduction; processor design; product engineering; reactive systems; real-time systems; routing; scheduling techniques; sequential circuits; system specification; test generation techniques; test theory; timing analysis;
Conference_Titel :
Computer-Aided Design, 1997. Digest of Technical Papers., 1997 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8200-0
DOI :
10.1109/ICCAD.1997.643250
