Title : 
A neural net model for unsupervised pattern classification and its application to image segmentation
         
        
            Author : 
Zheng, Nanning ; Zhang, Yuanliang ; Li, Wenming ; Shinsaku, Mori
         
        
            Author_Institution : 
Inst. of AI & Robotics, Xi´´an Jiaotong Univ., China
         
        
        
        
        
        
            Abstract : 
This paper describes a new neural net model for unsupervised pattern classification, which is known as generalized entropy mapping (GEM) net. The frame-work of generalized information entropic theory is described to represent the characteristics and performance of a GEM-net. The organization of a GEM-net is hierarchical. The principal contributions of the paper are mainly the following two aspects: (1) establishing the global optimization net based on generalized entropy measurement; and (2) a scheme of self-organizing cluster validation by means of unsupervised parallel recursive algorithm is proposed. The preliminary experimental results show that the performance of a GEM net is efficient
         
        
            Keywords : 
computer vision; entropy; image segmentation; neural nets; optimisation; parallel algorithms; pattern classification; generalized entropy mapping; generalized information entropic theory; hierarchical organisation; image segmentation; neural net model; self-organizing cluster validation; unsupervised parallel recursive algorithm; unsupervised pattern classification; Application software; Computer vision; Entropy; Hopfield neural networks; Image recognition; Image segmentation; Neural networks; Pattern classification; Pattern recognition; Robustness;
         
        
        
        
            Conference_Titel : 
Industrial Electronics, Control, and Instrumentation, 1995., Proceedings of the 1995 IEEE IECON 21st International Conference on
         
        
            Conference_Location : 
Orlando, FL
         
        
            Print_ISBN : 
0-7803-3026-9
         
        
        
            DOI : 
10.1109/IECON.1995.483984