Title :
Techniques for reducing hardware requirement of self checking combinational circuits
Author :
Pagey, Sandeep ; Sherlekar, S.D. ; Venkatesh, G.
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Bombay, India
Abstract :
The authors present two methods that can be used to reduce the hardware requirement for a self checking implementation of a given combinational function. They give examples to show that these give very significant reduction over the traditional SFS implementation. They believe that by careful use of such optimizations, the size of self checking implementations can be brought down within acceptable limits for use in practice
Keywords :
built-in self test; combinatorial circuits; design for testability; logic design; logic testing; barrel shifter; functional decomposition; optimizations; partitioning; self checking combinational circuits; Circuit faults; Combinational circuits; Computer science; Control systems; Cost function; Design methodology; Design optimization; Hardware; Integrated circuit interconnections; Sequential circuits;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224419