DocumentCode :
3211662
Title :
Positive photon discrimination for ultra low voltage IC analysis
Author :
Desplats, Romain ; Remmach, Mustapha ; Faggion, Gael ; Beaudoin, Felix ; Perdu, Philippe ; Leibowitz, Marty ; Sanchez, Kevin ; Guilaume, Sam ; Lundquis, Ted ; Lewis, Dean
Author_Institution :
Thales Lab., CNES, Toulouse, France
fYear :
2004
fDate :
25-29 April 2004
Firstpage :
361
Lastpage :
369
Abstract :
IC Debug is facilitated with Time Resolved Photon Emission, but acquisition times become unacceptably long at IC power supply voltages of <1V. Positive photon discrimination greatly reduces acquisition time by rapidly extracting switching events from the background noise.
Keywords :
integrated circuit reliability; integrated circuit testing; IC Debug; Time Resolved Photon Emission; acquisition time; acquisition times; background noise; positive photon discrimination; rapidly extracting switching events; ultra low voltage IC analysis; Background noise; Electron emission; Event detection; FETs; Hot carriers; Low voltage; Photonic integrated circuits; Power supplies; Silicon; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International
Print_ISBN :
0-7803-8315-X
Type :
conf
DOI :
10.1109/RELPHY.2004.1315353
Filename :
1315353
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3211662
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