Title :
Behavioral design and test assistance for pipelined processors
Author :
Iwashita, Hiroaki ; Nakata, Tsuneo ; Hirose, Fumiyasu
Author_Institution :
Fujitsu Lab. Ltd., Kawasaki, Japan
Abstract :
The authors propose a new concept in designing and testing processors. This approach generates behavioral-level test environments in VHDL for specific processor mechanisms, including automatic generations of test programs and behavioral descriptions. The authors have implemented an application to pipeline controllers
Keywords :
automatic programming; automatic testing; computer testing; logic CAD; pipeline processing; specification languages; VHDL; automatic generations of test programs; behavioral design; pipeline controllers; pipelined processors; test assistance; Automatic control; Automatic testing; Clocks; Design methodology; Hardware; Hazards; Laboratories; Pipeline processing; Process design; System testing;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224427
