Title :
Highly efficient fault simulation exploiting hierarchy in circuit description
Author :
Seiss, Bernhard H. ; Wittmann, Hannes C.
Author_Institution :
Tech. Univ. of Munich, Germany
Abstract :
A highly efficient fault simulation approach is presented taking advantage of the hierarchy which can be found in most of todays circuit descriptions. Evident graphs are introduced to represent the structure of the hierarchy. Numerous experimental results for industrial circuits with up 90000 gates demonstrate the efficiency of the approach with respect to acceleration and reduction of the memory requirements as compared to an efficient gate level fault simulator
Keywords :
digital simulation; fault location; logic testing; fault simulation; industrial circuits; logic testing; Acceleration; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Costs; Electronic design automation and methodology; Observability; Parallel processing;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224434