DocumentCode :
3211851
Title :
Highly efficient fault simulation exploiting hierarchy in circuit description
Author :
Seiss, Bernhard H. ; Wittmann, Hannes C.
Author_Institution :
Tech. Univ. of Munich, Germany
fYear :
1992
fDate :
26-27 Nov 1992
Firstpage :
46
Lastpage :
51
Abstract :
A highly efficient fault simulation approach is presented taking advantage of the hierarchy which can be found in most of todays circuit descriptions. Evident graphs are introduced to represent the structure of the hierarchy. Numerous experimental results for industrial circuits with up 90000 gates demonstrate the efficiency of the approach with respect to acceleration and reduction of the memory requirements as compared to an efficient gate level fault simulator
Keywords :
digital simulation; fault location; logic testing; fault simulation; industrial circuits; logic testing; Acceleration; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Costs; Electronic design automation and methodology; Observability; Parallel processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
Type :
conf
DOI :
10.1109/ATS.1992.224434
Filename :
224434
Link To Document :
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