Title :
Quiescent current testing of combinational circuits with bridging faults
Author :
Roca, Miquel ; Rubio, Antonio
Author_Institution :
Dept. of Phys., Univ. Illes Balears, Palma de Mallorca, Spain
Abstract :
The authors present a classification of bridging faults in ISCAS combinational circuits and analyze the LDDQ testability of this sort of faults. A procedure for test pattern generation is implemented and it is applied to these circuits. The problem of testing feedback bridging faults is also analyzed showing that this type of fault is also testable by IDDQ even if they exhibit an oscillating behaviour. This result is verified through simulated and experimental data
Keywords :
combinatorial circuits; digital simulation; electric current measurement; fault location; logic testing; CMOS; ISCAS combinational circuits; LDDQ testability; bridging faults; global current; oscillating behaviour; quiescent current testing; test pattern generation; topology; voltage waveform analysis; Bridge circuits; CMOS digital integrated circuits; CMOS technology; Circuit analysis; Circuit faults; Circuit testing; Combinational circuits; Feedback circuits; Logic circuits; Test pattern generators;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224437
