Title :
A chip and pixel qualification methodology on imaging sensors
Author :
Chen, Yuan ; Guertin, Steven M. ; Petkov, Mihail ; Nguyen, Duc N. ; Novak, Frank
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper presents a qualification methodology on imaging sensors. In addition to overall chip reliability characterization based on sensor´s overall figure of merit, such as Dark Rate, Linearity, Dark Current Non-Uniformity, Fixed Pattern Noise and Photon Response Non-Uniformity, a simulation technique is proposed and used to project pixel reliability. The projected pixel reliability is directly related to imaging quality and provides additional sensor reliability information and performance control.
Keywords :
CCD image sensors; CMOS image sensors; dark conductivity; integrated circuit reliability; integrated circuit testing; chip qualification methodology; dark current nonuniformity; dark rate; fixed pattern noise; imaging sensors; linearity; overall figure of merit; photon response nonuniformity; pixel qualification methodology; CMOS image sensors; CMOS process; Charge-coupled image sensors; Image sensors; Laboratories; Optical imaging; Pixel; Qualifications; Sensor arrays; Sensor phenomena and characterization;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International
Print_ISBN :
0-7803-8315-X
DOI :
10.1109/RELPHY.2004.1315367
