Keywords :
analogue integrated circuits; automatic testing; built-in self test; crosstalk; delays; design for testability; digital simulation; fault diagnosis; fault tolerance; formal verification; integrated circuit testing; integrated memory circuits; logic testing; mixed analogue-digital integrated circuits; program testing; system-on-chip; testing; BIST; DFT; SoC testing; analog testing; crosstalk fault testing; current testing; delay fault testing; fault detection; memory testing; mixed signal testing; software testing; test generation; test power reduction; test set compaction; test synthesis;
