DocumentCode
3211999
Title
Proceedings of the 11th Asian Test Symposium (ATS´02)
fYear
2002
fDate
20-20 Nov. 2002
Keywords
analogue integrated circuits; automatic testing; built-in self test; crosstalk; delays; design for testability; digital simulation; fault diagnosis; fault tolerance; formal verification; integrated circuit testing; integrated memory circuits; logic testing; mixed analogue-digital integrated circuits; program testing; system-on-chip; testing; BIST; DFT; SoC testing; analog testing; crosstalk fault testing; current testing; delay fault testing; fault detection; memory testing; mixed signal testing; software testing; test generation; test power reduction; test set compaction; test synthesis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
Conference_Location
Guam, USA
ISSN
1081-7735
Print_ISBN
0-7695-1825-7
Type
conf
DOI
10.1109/ATS.2002.1181675
Filename
1181675
Link To Document