DocumentCode :
3212045
Title :
Exact computation of maximally dominating faults and its application to n-detection tests
Author :
Polian, Ilia ; Pomeranz, Irith ; Becker, Bernd
Author_Institution :
Albert-Ludwigs-Univ., Freiburg, Germany
fYear :
2002
fDate :
18-20 Nov. 2002
Firstpage :
9
Lastpage :
14
Abstract :
n-detection test sets for stuck-at faults have been shown to be useful in detecting unmodeled defects. It was also shown that a set of faults, called maximally dominating faults, can play an important role in controlling the increase in the size of an n-detection test set as n is increased. In an earlier work, a superset of the maximally dominating fault set was used. In this work, we propose a method to determine exact sets of maximally dominating faults. We also define a new type of n-detection test sets based on the exact set of maximally dominating faults. We present experimental results to demonstrate the usefulness of this exact set in producing high-quality n-detection test sets.
Keywords :
Boolean functions; automatic test pattern generation; binary decision diagrams; fault diagnosis; logic testing; ATPG; BDD-based procedure; exact computation; exact set; fault dominance; formal techniques; high-quality test sets; maximally dominating faults; n-detection test sets; stuck-at faults; unmodeled defects; Application software; Boolean functions; Circuit faults; Circuit testing; Data structures; Electrical fault detection; Fault detection; Linear approximation; Size control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-1825-7
Type :
conf
DOI :
10.1109/ATS.2002.1181677
Filename :
1181677
Link To Document :
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