Title :
Methods to measure and to enhance the testability of behavioral descriptions of digital circuits
Author :
Santucci, Jean-Francois ; Dray, Gérard ; Boumédine, Marc ; Giambiasi, Norbert
Author_Institution :
L.E.R.I., Nimes, France
Abstract :
The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions
Keywords :
digital integrated circuits; integrated circuit testing; logic testing; behavioral descriptions; controllability; cost; digital circuits; internal modelling; observability; test pattern generation; testability; Automatic testing; Circuit faults; Circuit testing; Costs; Digital circuits; Electronic mail; Out of order; Process design; Signal design; Test pattern generators;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224448
