Cyclogen: automatic, functional-level test generator

Author

Ayari, Bechir ; Kaminska, Bozena

Author_Institution

Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada

fYear

1992

fDate

26-27 Nov 1992

Firstpage

124

Lastpage

129

Abstract

The authors have laid the foundations for a functional test generation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) for Boolean function manipulation. The CCM has been defined for one-output and multi-output electronic circuits predicting a minimal number of test vectors. This new test generation approach, called Cyclogen, has been implemented, and the tests for several functional primitives as well as for the ISCAS-85 benchmark circuits have been generated successfully. The results show that this approach is effective and promising

Keywords

Boolean functions; VLSI; automatic testing; integrated circuit testing; logic testing; performance evaluation; Boolean function manipulation; Cyclogen; IC testing; ISCAS-85 benchmark circuits; VLSI; cyclomatic complexity measure; functional-level test generator; graph theory; ordered binary decision diagram representation; test vectors; Automatic testing; Benchmark testing; Boolean functions; Circuit faults; Circuit testing; Data structures; Electric variables measurement; Graph theory; Logic circuits; Logic testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)

Conference_Location

Hiroshima

Print_ISBN

0-8186-2985-1

Type

conf

DOI

10.1109/ATS.1992.224449

Filename

224449