Title :
Cyclogen: automatic, functional-level test generator
Author :
Ayari, Bechir ; Kaminska, Bozena
Author_Institution :
Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
Abstract :
The authors have laid the foundations for a functional test generation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) for Boolean function manipulation. The CCM has been defined for one-output and multi-output electronic circuits predicting a minimal number of test vectors. This new test generation approach, called Cyclogen, has been implemented, and the tests for several functional primitives as well as for the ISCAS-85 benchmark circuits have been generated successfully. The results show that this approach is effective and promising
Keywords :
Boolean functions; VLSI; automatic testing; integrated circuit testing; logic testing; performance evaluation; Boolean function manipulation; Cyclogen; IC testing; ISCAS-85 benchmark circuits; VLSI; cyclomatic complexity measure; functional-level test generator; graph theory; ordered binary decision diagram representation; test vectors; Automatic testing; Benchmark testing; Boolean functions; Circuit faults; Circuit testing; Data structures; Electric variables measurement; Graph theory; Logic circuits; Logic testing;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224449
