DocumentCode
3212142
Title
A totally self-checking dynamic asynchronous datapath
Author
Yang, Jing-ling ; Choy, Chiu-Sing ; Chan, Cheong-Fat ; Pun, Kong-Pong
Author_Institution
Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
fYear
2002
fDate
18-20 Nov. 2002
Firstpage
27
Lastpage
32
Abstract
This paper investigates the inherent totally self-checking (TSC) property of one type of dynamic asynchronous datapath based on Differential Cascode Voltage Logic (DCVSL). As a result, a totally self-checking dynamic asynchronous datapath architecture is proposed. It is simpler than other similar approaches and represents a new approach to fault tolerant design.
Keywords
asynchronous circuits; automatic testing; error detection; fault simulation; integrated circuit testing; integrated logic circuits; logic testing; DCVSL; TSC property; differential cascode voltage logic; dynamic asynchronous datapath; self testing; totally self-checking property; Plasma welding; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
ISSN
1081-7735
Print_ISBN
0-7695-1825-7
Type
conf
DOI
10.1109/ATS.2002.1181680
Filename
1181680
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