Title :
A totally self-checking dynamic asynchronous datapath
Author :
Yang, Jing-ling ; Choy, Chiu-Sing ; Chan, Cheong-Fat ; Pun, Kong-Pong
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
Abstract :
This paper investigates the inherent totally self-checking (TSC) property of one type of dynamic asynchronous datapath based on Differential Cascode Voltage Logic (DCVSL). As a result, a totally self-checking dynamic asynchronous datapath architecture is proposed. It is simpler than other similar approaches and represents a new approach to fault tolerant design.
Keywords :
asynchronous circuits; automatic testing; error detection; fault simulation; integrated circuit testing; integrated logic circuits; logic testing; DCVSL; TSC property; differential cascode voltage logic; dynamic asynchronous datapath; self testing; totally self-checking property; Plasma welding; Sun;
Conference_Titel :
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
Print_ISBN :
0-7695-1825-7
DOI :
10.1109/ATS.2002.1181680
