DocumentCode
3212188
Title
Test limitations of parametric faults in analog circuits
Author
Savir, Jacob ; Guo, Zhen
Author_Institution
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
fYear
2002
fDate
18-20 Nov. 2002
Firstpage
39
Lastpage
44
Abstract
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.
Keywords
analogue circuits; analogue integrated circuits; circuit testing; fault simulation; integrated circuit testing; analog fault detectability; linear analog circuits; parametric fault testing; parametric faults; symbolic transfer function; test limitations; time-invariant analog circuits; Analog circuits; Circuit faults; Circuit testing; DVD;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
ISSN
1081-7735
Print_ISBN
0-7695-1825-7
Type
conf
DOI
10.1109/ATS.2002.1181682
Filename
1181682
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