Title :
Test limitations of parametric faults in analog circuits
Author :
Savir, Jacob ; Guo, Zhen
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.
Keywords :
analogue circuits; analogue integrated circuits; circuit testing; fault simulation; integrated circuit testing; analog fault detectability; linear analog circuits; parametric fault testing; parametric faults; symbolic transfer function; test limitations; time-invariant analog circuits; Analog circuits; Circuit faults; Circuit testing; DVD;
Conference_Titel :
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
Print_ISBN :
0-7695-1825-7
DOI :
10.1109/ATS.2002.1181682
