Effects of amplitude modulation in jitter tolerance measurements of communication devices

Author

Ishida, Masahiro ; Yamaguchi, Takahiro J. ; Soma, Mani ; Musha, Hirobumi

Author_Institution

Advantest Labs., Ltd., Miyagi, Japan

fYear

2002

fDate

18-20 Nov. 2002

Firstpage

45

Lastpage

48

Abstract

This paper presents an experimental study of random jitter modulation in a commercial serializer-deserializer device to demonstrate the effects of possible amplitude modulation in jitter tolerance measurements. The paper recommends alternative methods for injecting random jitter to avoid this source of measurement error.

Keywords

amplitude modulation; data communication equipment; error statistics; measurement errors; measurement standards; telecommunication equipment testing; timing jitter; tolerance analysis; SerDes devices; T11 standard; bit-error rate; clock recovery; clock timing jitter measurement; communication device jitter tolerance measurements; jitter measurement amplitude modulation effects; measurement error sources; random jitter injection methods; random jitter modulation; serializer-deserializer devices; Amplitude modulation; Clocks; Degradation; Electric variables measurement; Filters; Frequency; Measurement standards; Testing; Timing jitter; White noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian

ISSN

1081-7735

Print_ISBN

0-7695-1825-7

Type

conf

DOI

10.1109/ATS.2002.1181683

Filename

1181683