Title :
Effects of amplitude modulation in jitter tolerance measurements of communication devices
Author :
Ishida, Masahiro ; Yamaguchi, Takahiro J. ; Soma, Mani ; Musha, Hirobumi
Author_Institution :
Advantest Labs., Ltd., Miyagi, Japan
Abstract :
This paper presents an experimental study of random jitter modulation in a commercial serializer-deserializer device to demonstrate the effects of possible amplitude modulation in jitter tolerance measurements. The paper recommends alternative methods for injecting random jitter to avoid this source of measurement error.
Keywords :
amplitude modulation; data communication equipment; error statistics; measurement errors; measurement standards; telecommunication equipment testing; timing jitter; tolerance analysis; SerDes devices; T11 standard; bit-error rate; clock recovery; clock timing jitter measurement; communication device jitter tolerance measurements; jitter measurement amplitude modulation effects; measurement error sources; random jitter injection methods; random jitter modulation; serializer-deserializer devices; Amplitude modulation; Clocks; Degradation; Electric variables measurement; Filters; Frequency; Measurement standards; Testing; Timing jitter; White noise;
Conference_Titel :
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
Print_ISBN :
0-7695-1825-7
DOI :
10.1109/ATS.2002.1181683
