Title :
On-chip analog response extraction with 1-bit Σ-Δ modulators
Author :
Hong, Hao-Chiao ; Huang, Jiun-Lang ; Cheng, Kwang-Ting ; Wu, Cheng-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Because of their relative robustness to process variation, Σ-Δ modulation techniques are particularly suitable for VLSI implementations. In this paper, we propose to employ the 1-bit Σ-Δ modulation ADC (analog-to-digital converter) as the on-chip analog response extractor for analog/mixed-signal BIST (built-in self-test) applications. To validate the idea, a prototype chip with the proposed BIST circuitry has been designed and fabricated. Performance of the BIST circuitry is validated (up to 87 dB dynamic range), and measurement results of the circuit under test (CUT), a 2nd-order low-pass filter, are presented.
Keywords :
VLSI; built-in self test; integrated circuit design; integrated circuit measurement; integrated circuit testing; low-pass filters; mixed analogue-digital integrated circuits; sigma-delta modulation; 1 bit; BIST circuitry dynamic range; VLSI; analog/mixed-signal BIST; built-in self-test; on-chip analog response extraction; process variation robustness; second-order low-pass filters; sigma-delta modulators; sigma-delta one-bit modulation ADC; Built-in self-test; Circuit testing; Delta modulation; Digital modulation; Distortion measurement; Frequency measurement; Performance evaluation; Robustness; Signal resolution; System testing;
Conference_Titel :
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
Print_ISBN :
0-7695-1825-7
DOI :
10.1109/ATS.2002.1181684
