Title :
A Novel Overmodulation and Field Weakening Strategy for Direct Torque Control of Induction Machines
Author :
Jidin, A. ; Idris, N. R N ; Yatim, A.H.M. ; Elbuluk, M.
Author_Institution :
Dept. of Energy Conversion, Fac. of Electr. Eng., UTM, Skudai
Abstract :
This paper presents a new simple overmodulation strategy in direct torque control (DTC) of induction machines. The strategy increases the inverter voltage limit and therefore extends the constant torque region. The minor modification on the conventional flux weakening method is also introduced to improve the torque capability in the field weakening region and hence improving the operation over a wide speed range. These strategies are implemented with a DTC-constant switching frequency (CSF) based system. To perform the DTC-CSF in overmodulation mode, the flux error status is modified before it is being fed to the voltage vector selection table. With this proposed strategy, a single-mode overmodulation based on stator flux vector control with smooth PWM to six-step transition is developed. This strategy also proposes a dynamic overmodulation to obtain fast torque transient with six-step operation including the field weakening region. The proposed strategy has been verified through computer simulations and shown to improve the torque capability of DTC induction motor drives with a fast dynamic torque response.
Keywords :
PWM power convertors; asynchronous machines; induction motor drives; stators; torque control; DTC-constant switching frequency; direct torque control; field weakening strategy; flux error status; induction machines; induction motor drives; inverter voltage limit; simple overmodulation strategy; single-mode overmodulation; smooth PWM; stator flux vector control; voltage vector selection table; Computer simulation; Induction machines; Induction motor drives; Machine vector control; Pulse width modulation; Pulse width modulation inverters; Stators; Switching frequency; Torque control; Voltage;
Conference_Titel :
Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
Conference_Location :
Edmonton, Alta.
Print_ISBN :
978-1-4244-2278-4
Electronic_ISBN :
0197-2618
DOI :
10.1109/08IAS.2008.175