• DocumentCode
    3212438
  • Title

    On-chip tap-delay measurements for a digital delay-line used in high-speed inter-chip data communications

  • Author

    Petre, Octavian ; Kerkhoff, Hans G.

  • Author_Institution
    Testable Design & Testing of Microsystems Group, MESA+ Res. Inst., Enschede, Netherlands
  • fYear
    2002
  • fDate
    18-20 Nov. 2002
  • Firstpage
    122
  • Lastpage
    127
  • Abstract
    During the last few years, new synchronization techniques to send data between ICs at increasingly high data-rates have been developed. Some of them rely on digital delay lines. The timing accuracy of the delay lines is crucial for good functionality of the synchronization mechanism. This paper presents a strategy to measure the tap-delays of a digital delay-line, using the well-known oscillation technique. The occurring measurement error for the presented technique has been calculated. Towards the end of the paper, a new delay-line scheme is shown. The tap-delay, measurement becomes much more accurate for this delay-line than for a standard delay-line.
  • Keywords
    circuit simulation; delay lines; integrated circuit design; integrated circuit modelling; integrated circuit testing; logic design; logic simulation; logic testing; measurement errors; synchronisation; timing circuits; timing jitter; data rates; delay line timing accuracy; digital delay-lines; high-speed inter-chip data communications; measurement errors; on-chip tap-delay measurement; oscillation measurement techniques; synchronization techniques/mechanisms; timing jitter; Circuit testing; Clocks; Data communication; Delay lines; Equations; Power supplies; Propagation delay; Synchronization; Temperature measurement; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1825-7
  • Type

    conf

  • DOI
    10.1109/ATS.2002.1181698
  • Filename
    1181698