DocumentCode :
3212495
Title :
Test requirement analysis for low cost hierarchical test path construction
Author :
Makris, Yiorgos ; Orailoglu, Alex
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
fYear :
2002
fDate :
18-20 Nov. 2002
Firstpage :
134
Lastpage :
139
Abstract :
We propose a methodology that examines design modules and identifies appropriate vector justification and response propagation requirements for reducing the cost of hierarchical test path construction. Test requirements are defined as a set of fine-grained input and output bit clusters and pertinent symbolic values. They are independent of actual test sets and are adjusted to the inherent module connectivity and regularity. As a result, they combine the generality required for fast hierarchical test path construction with the precision necessary for minimizing the incurred cost, thus fostering cost-effective hierarchical test.
Keywords :
design for testability; integrated circuit design; integrated circuit economics; integrated circuit testing; logic design; logic testing; modules; DFT hardware; cost-effective hierarchical testing; design module vector justification/response propagation requirements; fine-grained input/output bit clusters; local module test; logic testing; low cost hierarchical test path construction; module connectivity/regularity; symbolic values; test cost reduction; test precision; test requirement analysis; test sets; Cost function; Design for testability; Design methodology; Hardware; Logic testing; Modular construction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-1825-7
Type :
conf
DOI :
10.1109/ATS.2002.1181700
Filename :
1181700
Link To Document :
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