Title :
Fuzzy association rules for handling continuous attributes
Author :
Ishibuchi, Hisao ; Nakashima, Tomoharu ; Yamamoto, Takashi
Author_Institution :
Dept. of Ind. Eng., Osaka Prefecture Univ., Japan
Abstract :
Association rules are frequently used for describing association (i.e., co-occurrence) among attribute values in the field of data mining. When an attribute is continuous (i.e., real-valued) such as height, length and weight, its domain is usually discretized into several intervals. Fuzzy rules are recognized as a convenient tool for handling continuous attributes in a human understandable manner. When we use fuzzy rules, the domain of each continuous attribute is discretized into several fuzzy sets. A linguistic label is usually associated with each fuzzy set especially when linguistic interpretations of fuzzy rules are required. In this paper, we first fuzzify the concept of association rules. That is, we show fuzzy versions of two measures (i.e., confidence and support) that are used for evaluating each association rule in the field of data mining. Then we illustrate these two measures of fuzzy rules for function approximation and pattern classification problems. Finally we examine the relation between the classification performance of fuzzy rules and the definition of their certainty grades through computer simulations. Simulation results show that the direct use of confidence as a certainty grade is not always appropriate from the viewpoint of classification performance
Keywords :
data mining; function approximation; fuzzy set theory; pattern classification; certainty grade; certainty grades; classification performance; computer simulations; continuous attributes handling; data mining; function approximation; fuzzy association rules; fuzzy rules; fuzzy sets; linguistic interpretations; linguistic label; pattern classification; Association rules; Computational modeling; Computer simulation; Data mining; Function approximation; Fuzzy sets; Humans; Industrial engineering;
Conference_Titel :
Industrial Electronics, 2001. Proceedings. ISIE 2001. IEEE International Symposium on
Conference_Location :
Pusan
Print_ISBN :
0-7803-7090-2
DOI :
10.1109/ISIE.2001.931767