• DocumentCode
    3212769
  • Title

    A new learning approach to design fault tolerant ANNs: finally a zero HW-SW overhead

  • Author

    Vargas, Fabian ; Lettnin, Djones ; Brum, Diogo ; Prestes, Dárcio

  • Author_Institution
    Electr. Eng. Dept., Catholic Univ., Porto Alegre, Brazil
  • fYear
    2002
  • fDate
    18-20 Nov. 2002
  • Firstpage
    218
  • Lastpage
    223
  • Abstract
    We present a new approach to design fault tolerant artificial neural networks (ANNs). Additionally, this approach allows estimating the final network reliability. This approach is based on the mutation analysis technique and is used during the training process of the ANN. The basic idea is to train the ANN in the presence of faults (single-fault model is assumed). To do so, a set of faults is injected into the code describing the ANN. This procedure yields mutation versions of the original ANN code, which in turn are used to train the network in an iterative process with the designer until the moment when the ANN is no longer sensible to the single faults injected. In other words, the network became tolerant to the considered set of faults. A practical example where an ANN is used to recognize an electrocardiogram (ECG) and to measure ECG parameters illustrates the proposed methodology.
  • Keywords
    electrocardiography; fault tolerance; fault tolerant computing; iterative methods; learning systems; neural nets; ANN description code; ANN learning; ECG parameter measurement; artificial neural network training process; code injected fault sets; electrocardiogram recognition; fault present training; fault tolerant ANN; fault-tolerant computing systems; iterative network training process; mutation analysis; network reliability estimation; single-fault models; zero hardware/software overhead; Artificial intelligence; Artificial neural networks; Biology computing; Computer networks; Electrocardiography; Fault tolerance; Fault tolerant systems; Genetic mutations; Intelligent systems; Process design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1825-7
  • Type

    conf

  • DOI
    10.1109/ATS.2002.1181714
  • Filename
    1181714