• DocumentCode
    3212893
  • Title

    Effects of substrate temperature on structural and optical properties of S-doped ZnO films

  • Author

    Yu, Wei ; Wu, Yanhua ; Gao, Wei ; Teng, Xiaoyun ; Chen, Mingjing ; Fu, Guangsheng

  • Author_Institution
    Key Lab. of Photo-Electr. Inf. Mater. of Hebei Province, Hebei Univ., Baoding, China
  • Volume
    3
  • fYear
    2011
  • fDate
    29-31 July 2011
  • Abstract
    S-doped ZnO films were fabricated on sapphire (0001) substrates by pulsed-laser deposition at different substrate temperatures. Effects of the substrate temperature on the structural and optical characteristic of S-ZnO films were studied by scanning electron microscopy (SEM), X-ray diffraction (XRD), UV-Vis spectrophotometer and fluorescence spectrometer. The results show that the S-doped ZnO thin films are wurtzite crystal structure. And the crystalline quality of S-doped ZnO films improves with increasing the substrate temperature from 400°C to 500°C. And the S/O ration is slowly decreased with substrate temperature elevation attributed to instability of S under the higher deposition temperature conditions. The absorption edges of S-doped ZnO thin films slightly shift blue as the substrate temperature increase from 400°C to 600°C. The photoluminescence (PL) spectra indicates that the visible emissions of S-doped ZnO films are enhanced, as well as the UV emission is weakened comparing to the pure ZnO thin film. It is illuminated that S-doping of ZnO can modify the optical properties of ZnO, which is promising for optoelectronic applications that work in the visible emission region.
  • Keywords
    II-VI semiconductors; X-ray diffraction; fluorescence; photoluminescence; pulsed laser deposition; scanning electron microscopy; semiconductor growth; semiconductor thin films; spectral line shift; sulphur; ultraviolet spectra; visible spectra; wide band gap semiconductors; zinc compounds; Al2O3; IV emission; SEM; SEMcrystalline quality; SEMfluorescence; SEMwurtzite crystal structure; UV-Vis spectrophotometer; X-ray diffraction; XRD; ZnO:S; absorption edges; blue shift; optical properties; photoluminescence spectra; pulsed-laser deposition; sapphire (0001) substrates; scanning electron microscopy; structural properties; substrate temperature; temperature 400 degC to 500 degC; thin films; visible emissions; Annealing; Crystals; Films; Optical diffraction; Optical imaging; Temperature measurement; Zinc oxide; S-doped ZnO thin films; photoluminescence; pulsed-laser deposition; substrate temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Optoelectronics (ICEOE), 2011 International Conference on
  • Conference_Location
    Dalian
  • Print_ISBN
    978-1-61284-275-2
  • Type

    conf

  • DOI
    10.1109/ICEOE.2011.6013337
  • Filename
    6013337