• DocumentCode
    3213104
  • Title

    Identification of brain white matter regions for diagnosis of Alzheimer using Diffusion Tensor Imaging

  • Author

    Patil, Ravindra B. ; Piyush, Ranjan ; Ramakrishnan, Shankar

  • Author_Institution
    Dept. of Appl. Mech., Indian Inst. of Technol. Madras, Chennai, India
  • fYear
    2013
  • fDate
    3-7 July 2013
  • Firstpage
    6535
  • Lastpage
    6538
  • Abstract
    Diffusion Tensor Imaging (DTI) technique is widely used to probe the white matter (WM) tracts, which is affected most by neurological disorders. The fractional anisotropy (FA) metric has been used predominantly to study changes in the WM tracts. Here an attempt is made to delineate specific regions of interest in the WM that may be probable indicators for the diagnosis of Alzheimer disease (AD). Genetic algorithm has been used as feature reduction method along with Adaptive Boosting (AdaBoost) machine learning technique to determine the most prominent regions in the WM that are indicators of AD. It is found in this study that Fornix region of WM is most affected by Alzheimer. Further, classification was done to differentiate between Alzheimer and Normal controls with accuracy of 84.5%. The results obtained were validated by comparing with the existing literature on Alzheimer.
  • Keywords
    biodiffusion; biomedical MRI; brain; diseases; feature extraction; genetic algorithms; learning (artificial intelligence); medical disorders; medical image processing; neurophysiology; AD indicators; Adaptive Boosting machine learning technique; Alzheimer disease diagnosis; Fornix region; Genetic algorithm; brain white matter region identification; diffusion tensor imaging; feature reduction method; fractional anisotropy metric; neurological disorder; specific regions of interest; Accuracy; Alzheimer´s disease; Anisotropic magnetoresistance; Boosting; Diffusion tensor imaging; Feature extraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
  • Conference_Location
    Osaka
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2013.6611052
  • Filename
    6611052