Title :
Modeling intrinsic electrophysiology of AII amacrine cells: Preliminary results
Author :
Apollo, Nicholas ; Grayden, David B. ; Burkitt, Anthony N. ; Meffin, Hamish ; Kameneva, Tatiana
Author_Institution :
Dept. of Electr. Electron. Eng., Univ. of Melbourne, Melbourne, VIC, Australia
Abstract :
In patients who have lost their photoreceptors due to retinal degenerative diseases, it is possible to restore rudimentary vision by electrically stimulating surviving neurons. AII amacrine cells, which reside in the inner plexiform layer, split the signal from rod bipolar cells into ON and OFF cone pathways. As a result, it is of interest to develop a computational model to aid in the understanding of how these cells respond to the electrical stimulation delivered by a prosthetic implant. The aim of this work is to develop and constrain parameters in a single-compartment model of an AII amacrine cell using data from whole-cell patch clamp recordings. This model will be used to explore responses of AII amacrine cells to electrical stimulation. Single-compartment Hodgkin-Huxley-type neural models are simulated in the NEURON environment. Simulations showed successful reproduction of the potassium currentvoltage relationship and some of the spiking properties observed in vitro.
Keywords :
bioelectric phenomena; cellular biophysics; diseases; eye; neurophysiology; potassium; prosthetics; AII amacrine cells; NEURON environment; OFF cone pathways; ON cone pathways; computational modeling; electrical stimulation; electrically stimulating surviving neurons; intrinsic electrophysiology modeling; photoreceptors; potassium current-voltage relationship; prosthetic implant; retinal degenerative diseases; rod bipolar cells; rudimentary vision; single-compartment Hodgkin-Huxley-type neural models; single-compartment model; spiking properties; whole-cell patch clamp recordings; Data models; Implants; In vitro; Mathematical model; Neurons; Retina; Visualization;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6611056