DocumentCode :
3213307
Title :
Core-clustering based SoC test scheduling optimization
Author :
Huang, Yu ; Reddy, Sudhakar M. ; Cheng, Wu-Tung
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
fYear :
2002
fDate :
18-20 Nov. 2002
Firstpage :
405
Lastpage :
410
Abstract :
In this paper, a method is presented to schedule tests for core-based SoCs to achieve optimal test completion time for the SoC design by simultaneously determining optimal core clustering, core cluster wrapper width, and pin mapping. For the first time the above mentioned techniques are applied concurrently to solve the SoC test scheduling problem. A heuristic algorithm implementing these techniques to determine an optimal solution is proposed.
Keywords :
automatic testing; bin packing; integrated circuit testing; logic testing; optimisation; scheduling; system-on-chip; SoC test scheduling optimization; core cluster wrapper width; core-clustering based SoCs; heuristic algorithm; optimal core clustering; optimal test completion time; pin mapping; Cities and towns; Clustering algorithms; Energy consumption; Graphics; Heuristic algorithms; Job shop scheduling; Pins; Processor scheduling; Tellurium; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-1825-7
Type :
conf
DOI :
10.1109/ATS.2002.1181745
Filename :
1181745
Link To Document :
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