• DocumentCode
    3213839
  • Title

    MESFET small signal model parameter extraction using particle swarm optimization

  • Author

    Sabat, Samrat L. ; Raju, Vijay ; Ali, Layak

  • Author_Institution
    Sch. of Phys., Univ. of Hyderabad, Hyderabad, India
  • fYear
    2008
  • fDate
    14-17 Dec. 2008
  • Firstpage
    208
  • Lastpage
    211
  • Abstract
    This paper presents a novel particle swarm based optimization technique to extract small signal equivalent circuit model parameters of a fabricated GaAs MESFET device. The small signal model includes 16 different circuit elements and all are successfully and accurately extracted using the proposed technique. The proposed technique overcomes the difficulties of initial guess of solution and low convergence rate that occurs in conventional optimizer. The effectiveness of results show that the proposed algorithm is robust and accurately provides physically meaningful values for all the circuit elements. The efficiency of this approach is also demonstrated by the results that provides a good fit between measured and modeled S-parameter data over broad range of frequency between 0.5 to 25 GHz.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; equivalent circuits; gallium arsenide; particle swarm optimisation; semiconductor device manufacture; semiconductor device models; GaAs; MESFET; S-parameter data; circuit elements; extraction; frequency 0.5 GHz to 25 GHz; particle swarm optimization; small signal equivalent circuit model parameters; Data mining; Equivalent circuits; Gallium arsenide; MESFET circuits; Microelectronics; Microwave devices; Optimization methods; Parameter extraction; Particle swarm optimization; Scattering parameters; Extraction methodology; MESFET small signal model; Particle Swarm Optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2008. ICM 2008. International Conference on
  • Conference_Location
    Sharjah
  • Print_ISBN
    978-1-4244-2369-9
  • Electronic_ISBN
    978-1-4244-2370-5
  • Type

    conf

  • DOI
    10.1109/ICM.2008.5393521
  • Filename
    5393521