DocumentCode
3213859
Title
Design and Performance of a 200 kHz All-SiC JFET Current Source Converter
Author
Friedli, Thomas ; Round, Simon D. ; Hassler, Dominik ; Kolar, Johann W.
Author_Institution
Power Electron. Syst. Lab. (PES), ETH Zurich, Zurich
fYear
2008
fDate
5-9 Oct. 2008
Firstpage
1
Lastpage
8
Abstract
Silicon carbide (SiC) switching devices have been widely discussed in power electronics due to their desirable properties and are believed to set new standards in efficiency, switching behavior, and power density for state-of-the-art converter systems. In this paper the design, construction, and performance of a 3 kVA All-SiC Current Source Converter (CSC) also known as Current DC-Link Back-to-Back Converter (CLBBC), is presented. CSC topologies have been successfully used for many years for high power applications. However, for low power range converter systems they could not compete with Voltage Source Converter (VSC) topologies with capacitors in the DC-link, since the link inductor has always been a physically large and heavy component due to the comparatively low switching frequencies of conventional high blocking voltage silicon devices. New SiC switches such as the JFET, which are providing simultaneously high voltage blocking, low switching losses, and low on-state resistance, offer new possibilities and allow for implementing a high switching frequency CLBBC and thus reducing size and weight of the DC-link inductor. The prototype CLBBC has been designed specifically for latest generation 1200 V, 6 A SiC JFETs for a target switching frequency of 200 kHz.
Keywords
DC-DC power convertors; constant current sources; power inductors; silicon compounds; wide band gap semiconductors; DC-link inductor; JFET current source converter; SiC; current 6 A; current DC-link back-to-back converter; frequency 200 kHz; voltage 1200 V; Capacitors; Inductors; Power conversion; Power electronics; Silicon carbide; Silicon devices; Switching converters; Switching frequency; Topology; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
Conference_Location
Edmonton, Alta.
ISSN
0197-2618
Print_ISBN
978-1-4244-2278-4
Electronic_ISBN
0197-2618
Type
conf
DOI
10.1109/08IAS.2008.262
Filename
4659050
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