Title :
Bit-error-rate performance of inter-chip RF/wireless interconnect systems
Author :
Rahaman, Md Sajjad ; Chowdhury, Masud H.
Author_Institution :
Dept. of ECE, Univ. of Illinois at Chicago, Chicago, IL, USA
Abstract :
With the ever increasing degrees of integration, and operating speed in ultra large-scale integrated (ULSI) circuits conventional approaches of hard-wired metal interconnects are encountering fundamental limits. Several revolutionary approaches have been proposed for an alternative to metal interconnect. One of the most feasible approaches is RF/wireless interconnects. This paper evaluates the system bit-error-rate (BER) performance in an inter-chip RF/wireless interconnect system. The results indicate that for a certain range of received signal-to-noise (SNR) ratio, error control coding (ECC) improves the performance of the RF/wireless interconnect system. It is also shown analytically that performance can be improved at low SNR with the application of time-diversity approach by using interleaver and deinterterleaver.
Keywords :
ULSI; error statistics; integrated circuit interconnections; ULSI circuits; bit error rate; error control coding; inter-chip radiofrequency systems; signal-to-noise ratio; time-diversity; ultra large-scale integrated circuits; wireless interconnect systems; Bit error rate; CMOS technology; Data communication; Error correction codes; Integrated circuit interconnections; Network-on-a-chip; Performance analysis; RF signals; Radio frequency; Ultra large scale integration;
Conference_Titel :
Microelectronics, 2008. ICM 2008. International Conference on
Conference_Location :
Sharjah
Print_ISBN :
978-1-4244-2369-9
Electronic_ISBN :
978-1-4244-2370-5
DOI :
10.1109/ICM.2008.5393539